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Volume 12 - August 2006

Contents

Page 37 of 50

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Abstract

  • Precise Ion Milling and 3D TEM technique to Deal with Feature Blocking in TEM Viewing Semiconductor Devices

  • N Wang, W Gruenewald, S Miller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1240-1241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3D Elemental Mapping Using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam

  • J Wagner, M Hunkova, M Schmied, H Mulders, M Novak
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1242-1243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • New Developments in CrossBeam Technology

  • H Hoffmeister, A Schertel, A Thesen, P Ginauck
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1244-1245
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • New Method of Preparing Cross Sectional Samples and Ultra-Thin Foils for SEM and TEM by a Broad Argon Ion Beam

  • K Ogura, N Erdman, AR Campbell, S Asahina
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1246-1247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Gallium Phase Formation in Cu During 30kV Ga+ FIB Milling

  • JR Michael
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1248-1249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Generation of Spurious X-rays by Focused Ion Beams in Dual Beam Instruments

  • J Evertsen, M Toth, B Thiel, E Lifshin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1250-1251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Three-Dimensional Nanoscale Characterization of Pt Deposition from an Organometallic Precursor Induced by a Focused Ion Beam

  • SA Gerstl, A Morrone, R Kvitek
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1252-1253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparison of Ion-Specimen Interactions in Silicon & Molecular Materials

  • DJ Stokes, AL Bleloch
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1254-1255
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Looking Into van Gogh¡¦s Paintings with Focused Ion Beam (FIB)

  • U Zeile, R Haswell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1256-1257
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • FIB Imaging of Deformation in Aluminum Alloys for Advanced Automotive Applications

  • MW MishraPhaneuf, S Saimoto, RK PhaneufMishra
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1258-1259
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Reducing FIB Damage Using Low Energy Ions

  • LA Giannuzzi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1260-1261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Removal of Surface Damage from Focused Ion Beam using Plasma Cleaner

  • D-S Ko, YM Park, S-D Kim, Y-W Kim
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1262-1263
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials

  • SE Kooi, J-H Jang, C Ullal, EL Thomas
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1264-1265
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • In Situ Lift-Out for Coordinated Structure-Electron Transport and Structure-Isotope Studies

  • RM Stroud, TJ Zega, ML Taheri
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1266-1267
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Cryo FIB Applications: Metallographic Etching of Biological Materials; Cryolithography with Ice as an Environmentally Friendly Photoresist

  • WJ MoberlyChan, S Reyntjens, AM Minor
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1268-1269
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Focused Ion Beam (FIB) Preparation and Electron Microscopy Analysis of Individual Microbolometer Pixels

  • M Olszta, J Dougherty, M Horn, EC Dickey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1270-1271
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Electrical Characterization of a Single TiO2 Nanotube by Using Modified FIB/SEM

  • DK Cha, B Lee, J Huang, J Kim, RM Wallace, BE Gnade, MJ Kim
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1272-1273
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Analysis of Defects in HgCdTe and CdTe Epilayers on Si by Dual-Beam FIB

  • T Lee, J Huang, DK Cha, RN Jacobs, JH Dinan, MJ Kim
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1274-1275
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparison of Localized Modifications of the Contact Potential Difference Induced by Focussed Ion Beam Processing of n and p Doped Silicon.

  • MA Stevens-Kalceff, DP Kruss
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1276-1277
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Focused Ion Beam Based Micromanipulation to Form Air Bridge Interconnect

  • C Progl, J Vitarelli, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1278-1279
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 37 of 50