Advances in STEM Techniques for Materials Characterization
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Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces
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- 31 July 2006, pp. 1360-1361
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Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.
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- 31 July 2006, pp. 1362-1363
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High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.
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- 31 July 2006, pp. 1364-1365
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The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures
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- 31 July 2006, pp. 1366-1367
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Low-Voltage Dark-Field STEM Imaging with Optimum Detection Angle
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- 31 July 2006, pp. 1368-1369
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Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
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- 31 July 2006, pp. 1370-1371
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A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
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- 31 July 2006, pp. 1372-1373
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[1-100]/(11-22) Twin Boundaries in Wurtzite ZnO and Group III-Nitrides
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- 31 July 2006, pp. 1374-1375
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Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping
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Early X-ray Mapping in Electron Probe Microanalysis
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- 31 July 2006, pp. 1376-1377
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Improvements in Mapping and Microanalysis by FEG-EPMA
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- 31 July 2006, pp. 1378-1379
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X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD)
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- 31 July 2006, pp. 1380-1381
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Sensitivity and Accuracy in Processing X-ray Spectrum Images
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- 31 July 2006, pp. 1382-1383
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Cryo-STEM EELS Mapping of Polymer Nanocolloids Preserved in Amorphous Ice
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- 31 July 2006, pp. 1384-1385
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2D and 3D Elemental Mapping of Biological Structures by Energy-Filtered TEM
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- 31 July 2006, pp. 1386-1387
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Uncovering Nanoscale Chemical Variations in the Third Dimension; Electron Tomography in the Analytical Mode
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- 31 July 2006, pp. 1388-1389
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Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector
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- 31 July 2006, pp. 1390-1391
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Chemical Imaging with Auger Electron Spectroscopy
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- 31 July 2006, pp. 1392-1393
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Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images
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- 31 July 2006, pp. 1394-1395
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Chemical Imaging by Soft X-ray Scanning Transmission X-ray Microscopy
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- 31 July 2006, pp. 1396-1397
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Compositional Imaging at the Atomic Scale with Atom Probe Tomography
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- 31 July 2006, pp. 1398-1399
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