Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 12
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 12 - August 2006

Contents

Page 41 of 50

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Abstract

  • 3-D Characterization of Biomaterials with Cluster SIMS

  • C Mahoney, G Gillen, A Fahey, J Yu, JA Gardella
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1400-1401
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Multi-technique, Multivariate Analysis Methods for Enhanced Sample Characterization

  • K Artyushkova, S Pylypenko, J Fenton, K Archuleta, L Williams, J Fulghum
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1402-1403
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • X-Ray Mapping and Post Processing

  • R Wuhrer, K Moran, MR Phillips
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1404-1405
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • X-Ray Mapping Using a Multiple-EDS (DUAL) Detectors

  • R Wuhrer, K Moran, MR Phillips, P Davey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1406-1407
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Advanced High-Energy Resolution Silicon Drift Detectors

  • R Terborg, M Rohde
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1408-1409
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Spectrum Imaging Analysis of Secondary Phases in Aluminum Alloy 6063

  • S Claves, M Watanabe
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1410-1411
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • X-ray Mapping of Terrestrial and Extraterrestrial Materials Using the Electron Microprobe: A Progress Report

  • P Carpenter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1414-1415
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Performance of a 30 mm2 Silicon Drift Detector

  • D Rohde, D Stocker, M Misenheimer, J Howard
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1418-1419
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • The Application of Micro Area Analysis of Al-Cu Junction by Wavelength-Dispersive EPMA Equipped with a FE Electron Gun.

  • T Kimura, T Ogiwara, S Fukushima, S Tanuma
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1420-1421
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Automatic Phase Labeling During Spectral Imaging Acquisitions

  • P Camus, J McCarthy, D Rohde
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1422-1423
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Ultrafast Electron Microscopy

Abstract

  • Effect of Coulomb Interactions on Resolution in Ultrafast Electron Microscopy

  • HH Rose, R Spehr
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1424-1425
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Ultrafast Electron Microscopy: The Problem of Spatial Coherence

  • WA Schroeder
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1426-1427
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electronic Thermal Expansion and the Mechanism of Coherent Acoustic Phonons Generation in Metals

  • S Nie, H Park, X Wang, R Clinite, J Cao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1430-1431
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Single Shot Electron Diffraction Experiment Using a Sub ps MeV Electron Source

  • JF Schmerge, J Cardoza, J Castro, DH Dowell, SM Gierman, JB Hastings, H Loos, FM Rudakov, PM Weber
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1432-1433
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in Low Voltage Microscopy and Microanalysis

Abstract

  • Low Voltage Electron Microscopy of Organic Materials

  • L Drummy, J Chen, J Yang, D Martin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1434-1435
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Low Voltage and Low Vacuum- When worlds Collide

  • B Thiel, V Tileli
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1436-1437
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope

  • I Mullerova, I Konvalina
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1438-1439
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 41 of 50