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Volume 12 - August 2006

Contents

Page 35 of 50

Electron Energy Loss Spectroscopy for the 21st Century

Abstract

  • Optical Properties of Carbonaceous Aerosol Particles by Low-Loss EELS

  • DT L Alexander, PA Crozier, J Anderson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1160-1161
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Separation of Bulk and Surface-losses in Low-loss EELS Measurements in STEM

  • KA Mkhoyan, T Babinec, SE Maccagnano, EJ Kirkland, J Silcox
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1162-1163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • From Aircraft to Microchips: Science and Technology at the Atomic Scale

  • DA Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1164-1165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Optical Gap Measurements of Boron Nitride Nanotubes by EELS

  • R Arenal, O Stephan, M Kociak, D Taverna, A Loiseau, C Colliex
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1166-1167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Lifetime of Hot Electrons in Metals Retrived From Low Loss EELS

  • C Hébert, A Satz, G Kothleitner, C Eisenmenger-Sittner, P Schattschneider
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1168-1169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Screening of Individual Nanostructures with STEM-EELS and EFTEM Spectral Imaging

  • I Anderson, J Scott, K Klein, A Melechko, M Simpson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1170-1171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • An ELNES Study of SiO2 Nanowires Grown from a Patterned Reagent

  • F Wang, M Malac, RF Egerton, P Li, A Meldrum, MR Freeman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1172-1173
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Channeling Effects in High Angular Resolution Electron Spectroscopy

  • SD Findlay, C Witte, LJ Allen, MP Oxley, NJ Zaluzec
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1174-1175
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Measurement of k-value in Semiconductor Structures

  • PL Potapov, H-J Engelmann, E Zschech
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1176-1177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Studying Vanadium-based Perovskites by Scanning Transmission Electron Microscopy

  • M Chi, M Lane, Q Ramasse, R Ramesh, N Browning
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1178-1179
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Numerical Aspects of Valence Electron Energy Loss Spectrometry

  • T Galek, C Hébert, M Stöger-Pollach, P Schattschneider
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1180-1181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • EELS Compositional Imaging of FeF2-C Nanocomposite Used as a New Positive Electrode in Li-Ion Batteries

  • J Al-Sharab, F Cosandey, G Amatucci, J Bentley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1182-1183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Investigation of Diffraction Condition and Convergent Probe Effects on Inelastic Mean Free Path Determination by Using a Cone-Shaped Silicon Crystal

  • Q Jin, S Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1184-1185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Determining Inelastic Mean Free Path by Electron Energy Loss Spectroscopy

  • Q Jin, D Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1186-1187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Momentum-Resolved EELS Measurements of Hexagonal Boron Nitride

  • R Arenal, M Kociak, NJ Zaluzec
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • STEM/EELS Studies of Nanoparticles

  • C Mitterbauer, AL Pickering, SM Kauzlarich, PP Power, ND Browning
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1190-1191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Multidimensional Scaling of Solid-State Parameters with Plasmon Energy and In-situ Spectro-Microscopic Determination and Imaging of Material Properties

  • V Oleshko
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1192-1193
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • TEM and EELS Analysis of Anodized Nb2O5: Stoichiometry and Field-Induced Crystallization

  • M Olszta, J Sloppy, J Wang, EC Dickey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1194-1195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Correction of Thickness Artifacts in EFTEM Elemental Mapping of BiologicalSpecimens

  • M Aronova, G Zhang, R Leapman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1196-1197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 35 of 50