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Volume 12 - August 2006

Contents

Page 33 of 50

Applications in Materials Science and Engineering

Abstract

  • The Atomic and Electronic Structure of the Dynamically Formed Cu/Cu2O Interface Structure

  • X Han, J Yang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1080-1081
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A TEM Study of Wet Oxidation of InAlP on GaAs

  • J Zhang, Y Cao, T Kosel, R Cook, D Hall
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Inversion Domain Boundaries in Wurtzite GaN

  • J Basu, D Ramachandran, S Kumar, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1084-1085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Oxygen Content of Twin Domains in YBCO by Geometric Phase Analysis

  • CL Johnson, Y Zhu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1086-1087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • TEM and EELS Study of Dislocation Loops in Reduced BaTiO3

  • GY Yang, EC Dickey, CA Randall
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Microscopic Examination of a Corrosion Front in Spent Nuclear Fuel

  • JA Fortner, AJ Kropf, RJ Finch, JC Cunnane
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1090-1091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Medium Range Order in Zr70Pd30 Metallic Glass Under Ion Irradiation.

  • AC Y Liu, DJ Miller, RC Birtcher
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Radiation Tolerance of A2B2O7 Compounds at the Cubic-Monclinic Boundary

  • KL Smith, MG Blackford, GR Lumpkin, K Whittle, NJ Zaluzec
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1094-1095
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

TEM Automation

Abstract

  • A Case Study in Automated Molecular Microscopy

  • S Stagg, J Pulokas, D Fellmann, A Cheng, J Quispe, S Mallick, R Avila, CS Potter, B Carragher
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1096-1097
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • EMEN2: A Flexible & Mineable Data/Metadata Archival System for Cryo-EM

  • H Tu, W Chiu, D Mann, SJ Ludtke
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1098-1099
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Automated, 100-Specimen Loading and Imaging System for Transmission Electron Microscopy

  • J Lefman, R Morrison, S Subramaniam
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1100-1101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Automatic Multiple Tilt Series Acquisition in Leginon

  • GJ Jensen, C Suloway, QS Zheng, DA Agard
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1102-1103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage

  • CS Own, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ZS Szilagyi, OL Krivanek
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1104-1105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Automated Data Collection for Serial Section TEM

  • D Fellmann, J Pulokas, B Carragher, CS Potter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1106-1107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Automated Data Quality Assessment in Electron Cryomicroscopy

  • H Khant, S Ludtke, W Chiu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1108-1109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • An Optimized Solution for Cryo Electron Tomography

  • W Voorhout, F De Haas, P Frederik, R Schoenmakers, W Busing, D Hubert
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1110-1111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Abstract

  • Application of a New High-Pressure Freezing Apparatus

  • H Krisp, G von Wichert, T Seufferlein, P Walther
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1112-1113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Improved Native Tissue Ultrastructure Investigations by High Pressure Freezing and Cryo-SEM

  • A Kaech, H Gross, R Wepf
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1114-1115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Development of Cryo-STEM for Scanning Electron Microscopy

  • H Dobberstein, H Duan, JN Skepper, M Hayles
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1116-1117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • In-Lens Cryo-HRSEM of a Freeze-Dried Coiled-Coil Protein Assembly

  • SN Dublin, VP Conticello, RP Apkarian
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1118-1119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 33 of 50