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Volume 12 - August 2006

Contents

Page 30 of 50

Microscopy and Microanalysis of Magnetic Materials

Abstract

  • Observation of Magnetic Circular Dichroism in the Electron Microscope

  • C Hébert, S Rubino, P Schattschneider, J Rusz, P Novak, C Hurm, J Zweck
  • Published online by Cambridge University Press:
    31 July 2006, pp. 960-961
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Magnetic Imaging. Excuse Me, What is Relevant for High Density Recording Technology?

  • J Ahner
  • Published online by Cambridge University Press:
    31 July 2006, pp. 962-963
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electronic Spin-Precession in Magnetic Nanostructures

  • C Klein, JC H Spence, AK Schmid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 966-967
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Nanoscale Characterization of Materials for Magnetic Recording Applications

  • D Larson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 968-969
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Second-Phase Defects in Ni-Mn-Ga Based Ferromagnetic Shape-Memory Alloys

  • ML Richard, J Feuchtwanger, B Peterson, SM Allen, RC O'Handley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 970-971
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • STEM Z-contrast and Electron Energy Loss Spectroscopy Characterization of Co-doped TiO2 Thin Films

  • L Fu, ND Browning, S Zhang, DC Kundaliya, SB Ogale, T Venkatesan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 974-975
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • TEM Study of Mn-Doped ZnO Thin Films Synthesized by PLD

  • XZ Li, J Zhang, DJ Sellmyer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 976-977
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • HARECES Observations of Magnetic Linear Dichroism in a Nickel Ferromagnet

  • NJ Zaluzec, Y Ito, RE Cook, DJ Miller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 978-979
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Fabrication and Characterization of Magnetic Nanostructures with Different Iron Concentration

  • M Takeguchi, M Shimojo, R Che, K Furuya
  • Published online by Cambridge University Press:
    31 July 2006, pp. 980-981
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Oxidation of Thin Al Layers for Magnetic Tunnel Barriers: a Three-dimensional Atom Probe Study

  • AK Petford-Long, DJ Larson, A Cerezo, PH Clifton, S Pinitsoontorn
  • Published online by Cambridge University Press:
    31 July 2006, pp. 982-983
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography

  • A Yasuhara, N Endo, T Suzuki, K Yamazaki, E Okunishi, H Furukawa, M Kersker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 984-985
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Micostructure and Magnetic Properties of FePt/MgO Multilayers

  • Y Fu, J Wittig, J Bentley, N Evans, B Lu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 986-987
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • TEM Study of Precipitation Behavior of Diluted Cu-Co Alloys

  • AL Rocha, G Solorzano, D Smith, M McCartney
  • Published online by Cambridge University Press:
    31 July 2006, pp. 988-989
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • STM Imaging of Vortices in FIB-Sculptured Mesoscopic Superconductors

  • G Karapetrov, M Iavarone, J Fedor, MT Marshall, R Divan, WK Kwok
  • Published online by Cambridge University Press:
    31 July 2006, pp. 990-991
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Metallographic Preparation & Analysis of Polymer Materials

Abstract

  • An Improved Technique for the Preparation of Mounted or Unmounted Carbon Epoxy Specimens

  • R Edahl
  • Published online by Cambridge University Press:
    31 July 2006, pp. 992-993
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Using Electron Microscopy to Investigate Degradation of Candidate PEM Membranes due to Exposure to Fenton¡¦s Reagent

  • S Weakley-Bollin, M Sulek
  • Published online by Cambridge University Press:
    31 July 2006, pp. 994-995
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Cryo-STEM EELS of Nafion Saturated with an Organic Solvent

  • S Yakovlev, M Libera
  • Published online by Cambridge University Press:
    31 July 2006, pp. 996-997
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • New Microscopies for Polymer Analysis... What's in YOUR toolkit?

  • B Foster
  • Published online by Cambridge University Press:
    31 July 2006, pp. 998-999
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 30 of 50