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Volume 12 - August 2006

Contents

Page 28 of 50

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos

Abstract

  • Multi-Voltage EPMA of Thin Films or Nano Science in the Z Dimension

  • J Donovan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 878-879
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Core Community Specifications for Electron Microprobe Operating Systems: Software, Quality Control, and Data Management Issues

  • J Fournelle, P Carpenter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 880-881
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Microanalysis of Transition Metal Substituted ZnO

  • S Kolesnik, B Dabrowski, RE Cook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 882-883
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Minute foreign materials analysis using mono-capillary with 10-micrometer spatial resolution

  • S Ohzawa, Y Yokota, D Matsunaga, S Komatani, K Obori, A Whitley, S Mamedov
  • Published online by Cambridge University Press:
    31 July 2006, pp. 884-885
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Development of Standardized Lunar Regolith Simulant Materials

  • P Carpenter, L Sibille, S Wilson, G Meeker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 886-887
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

50th Anniversary of Observation of Dislocations

Abstract

  • Accommodation of Grain Boundary Coherency Strain by Interfacial Disconnections

  • DL Medlin, D Cohen, RC Pond, A Serra, JA Brown, Y Mishin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 888-889
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Incipient Plasticity in Thin Films: An In-Situ TEM Indentation Study

  • J De Hosson, W Soer, A Minor, Z Shan, SA Syed Asif, OL Warren
  • Published online by Cambridge University Press:
    31 July 2006, pp. 890-891
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dislocations in Strontium Titanate

  • W Sigle, D Brunner, Z Zhang, S Taeri, C Sarbu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 892-893
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy

  • M Hytch, J-L Putaux, J Thibault
  • Published online by Cambridge University Press:
    31 July 2006, pp. 894-895
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Local Strain and Rotation at Low-Angle Grain Boundaries

  • CL Johnson, MJ Hÿtch, P.R. Buseck
  • Published online by Cambridge University Press:
    31 July 2006, pp. 896-897
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Diffraction-Contrast Analysis of Dislocation Loops in BCC Alloys

  • J Bentley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 898-899
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Background Intensity Problems in High Resolution Defect Imaging

  • A Howie, N Jiang, J Spence, J Wu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 900-901
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dislocations in Silicon: New Results, New Challenges...

  • J Rabier
  • Published online by Cambridge University Press:
    31 July 2006, pp. 902-903
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Hollow Core Dislocations in GaN

  • D Cherns
  • Published online by Cambridge University Press:
    31 July 2006, pp. 904-905
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Evolution of Threading Dislocations in GaN Films Grown on (111) Si Substrates with Various Buffer Layers

  • X Weng, J Acord, A Jain, S Raghavan, J Redwing, E Dickey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 906-907
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Strain Relief at Finite-Sized Grain Boundaries Drives Dislocation Emission

  • EA Marquis, JC Hamilton, DL Medlin, F Leonard
  • Published online by Cambridge University Press:
    31 July 2006, pp. 908-909
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Qualitative Evaluation of EBSD Technique for the Study of Plastic Deformation

  • J Cocle, P Hovington, M Lagacé, R Gauvin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 910-911
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Screw Dislocations and Spriral Growth in Abalone Shell Nacre

  • A Epstein, A Akey, N Yao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 912-913
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Mg Segregation at Coherent and Semi-Coherent Al/Al3Sc Interfaces

  • EA Marquis, JL Riesterer, DN Seidman, DJ Larson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 914-915
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Diffuse Scattering of Electrons by Individual nm-sized Defects Reveals New Structural Details

  • M Kirk, R Davidson, Z Zhou, S Dudarev, M Jenkins, A Sutton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 916-917
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 28 of 50