Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices

Abstract

Identification of Tin Whisker Growth on Tin Plated Copper Substrate

Microscopic Analysis of Tin Whisker Growth on Tin Plated Copper Microchip Leads.

Interfacial Strain Mapping and Chemical Analysis of Strained-Interface Heterostructures by Nanodiffraction and Electron Energy-Loss Spectroscopy

Imaging and Spectroscopy of Beam Sensitive Materials

Abstract

TEM Investigations of Peptoid Structures

Determining Nanoscale Molecular Ordering in Semiconducting Polymers

Nanobeam Scanning Diffraction for Orientation Mapping of Polymers

4d Imaging of Polymer Electrolyte Membrane Fuel Cell Cathodes by Scanning X-Ray Microscopy

Three Dimensional Microstructure Characterization of Polypropylene Blends

Automated image acquisition and analysis of beam sensitive samples

Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method

Electron Beam-Induced Object Excitations at Atomic Resolution - Minimization and Exploitation

Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy

Application of Electron Counting to Electron Energy-loss Spectroscopy and Implications for Low-Dose Characterization

Recent Advances on Imaging Porous Frameworks by Electron Microscopy Methods

Structure Determination of Molecular Sieve Nanoparticles with Electron Microscopy and Powder X-Ray Diffraction

Characterization of MEL defects in 2 - Dimensional MFI nanosheets

Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)

Direct Detection Image Detector and Electron Counting - A New Tool for High Resolution Imaging of Metal-organic Frameworks

Revealing the Structure of Graphitic Carbon Nitride through Low-Dose TEM using a Direct Electron Detector

Determining Optical Absorption Coefficients in Beam Sensitive Materials using Monochromated Electron Energy-Loss Spectroscopy

Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices

Abstract

Imaging and Spectroscopy of Beam Sensitive Materials

Abstract