Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract

Correlating Surface Roughness and Binder Erosion to Tint Retention of Coatings

Honeycomb Networks of Metal Oxides from Self-Assembling PS-PMMA Block Copolymers

Microstructure and Electrical Conductivity of (Y, Sr)CoO3-δ Thin Films Tuned by the Film-Growth Temperature

Epitaxial Growth and Atomic-Scale Investigation of Dielectric Ca1.46Nb1.11Ti1.38O7 Thin Films

Statistical Measurement of Polar Displacements in Complex Oxides

Influence of Bulk Polarization and Surface Polarity on Surface Reconstructions and Related Local Properties of Multiferroic BiFeO3 Film

The Interactions of Ferroelectric Domain Walls and Crystallographic Defects in the PbTiO3 Films

Atomic Level Structural Modulations at the Negatively Charged Domain Walls in BiFeO3 Films

Zr-doped Al2O3 Grain Boundary and Interfacial Microstructure

Direct Polarity Determination of Ferroelectric Ca0.28Ba0.72Nb2O6 Single Crystal by Combined Defocused Convergent Beam Electron Diffraction and Simulation

Simultaneous Structural and Electrical Analysis of Vanadium Dioxide Using In Situ TEM

Study of Yttria-Tantala Binary Using Scanning Transmission Electron Microscopy

Supper lattice structure transformation based on nonstoichiometric bismuth oxychloride

Multimodal Imaging of Cation Disorder and Oxygen Deficiency-Mediated Phase Separation in Double Perovskite Oxides

In Situ Observation of Phase Separation in High-Temperature Superconductor La2-xSrxCuO4

Modulating the Redox Equilibrium of Silver Using Electron Beams

Formation of Single-atom-thick Copper Oxide Monolayers

Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Ab-initio Simulations

Characterization of the Molecular Crystal L-Alaninium Oxalate by Raman Microscopy, Optical Microscopy and X-ray Powder Diffraction

Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices

Abstract

Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures

Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract

Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices

Abstract