Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Near-Field Mid-Infrared Plasmonics in Complex Nanostructures with Monochromated Electron Energy Loss Spectroscopy

Interaction between Relativistic Electrons and Mesoscopic Plasmonic Tapers

Understanding Imaging and Energy-loss Spectra Due to Phonon Excitation

Localized signals in vibrational STEM-EELS

Investigating Molecule-plasmon Interactions in Chemically-functionalized Metal Nanoparticles Using Monochromated EELS

Chemical Nano-Imaging with Tip-Enhanced Vibrational Spectroscopy

Exploring Vibrational and Valence Loss Spectra from Oxide Nanoparticles

Detecting Sub Bandgap Energies in CIGS with Electron Energy-Loss Spectroscopy

Local Mapping of Bandgap Electronic State in PrxCe1-xCh2-δ: Elucidating Enhancement and Mechanism of Grain Boundary Electrical Conductivity

Understanding guided light modes in oxide nanoparticles with monochromated EELS

Ultra-High Energy Resolution EELS

STEM-EELS Evaluation of the Dependence of Localized Surface Plasmon Linewidth on the Size of Au Nanoparticles

Predicting the Electronic Structure of CeO2 Grain Boundaries for Comparison with Atomic Resolution EELS

EELS Investigation of Al2O3 at 30 keV and below; First Results of Alumina's Structural Sensitivity to a Low-Energy Electron Beam

Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?

Probing Interfacial and Surface Effects with Vibrational Electron Energy Loss Spectroscopy

Ultrahigh Resolution of Electron Energy Loss Spectroscopy by a Monochromated Titan TEM: Towards Challenging Nanomaterials Characterization

Monochromated EELS and Optical Spectroscopy of Layered Carbon Nitrides

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract

Imaging Point Defects in Complex Oxides Using Quantitative STEM

Influence of Substrate Temperature and Dopant Distribution at Two-Dimensionally Doped Superconducting La2CuO4 Interfaces

Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract