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Imaging Point Defects in Complex Oxides Using Quantitative STEM

Published online by Cambridge University Press:  04 August 2017

Honggyu Kim ,
Jack Y. Zhang  and
Susanne Stemmer
Honggyu Kim
Affiliation:
Materials Department, University of California, Santa Barbara, USA.
Jack Y. Zhang
Affiliation:
Materials Department, University of California, Santa Barbara, USA.
Susanne Stemmer
Affiliation:
Materials Department, University of California, Santa Barbara, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1568 - 1569
Copyright
© Microscopy Society of America 2017 

References

[1] Hwang, J., et al, Phys. Rev. Lett. 111 2013 266101.Google Scholar
[2] Zhang, J. Y., et al, Sci. Rep. 5 2015 12419.Google Scholar
[3] Kim, H., et al, Phys. Rev. X 6 2016 041063.Google Scholar
[4] The authors acknowledge support by the U.S. Department of Energy (Grant No. DEFG02-02ER45994).Google Scholar