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Detecting Sub Bandgap Energies in CIGS with Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  04 August 2017

Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA.
Pran K. Paul
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA.
Shankar Karki
Affiliation:
Dept. of Electrical & Computer Engineering, Old Dominion University, Norfolk, VA, 23529, USA.
Sylvain Marsillac
Affiliation:
Dept. of Electrical & Computer Engineering, Old Dominion University, Norfolk, VA, 23529, USA.
Aaron R. Arehart
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA.
Tyler J. Grassman
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA. Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA.
David W. McComb
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Paul, P.K., et al., IEEE J. Photovolt. 5, 14821486, 2015.Google Scholar
[2] Stoger-Pollach, M., Franco, H., Schattschneider, P., Lazar, S., Schaffer, B., Grogger, W. & Zandbergen, H. W. Micron 37 , 396 2006.Google Scholar
[3] Egerton, R. F. Electron energy-loss spectroscopy in the electron microscope, 2nd Edition Plenum press New York 1996.Google Scholar