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Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures

Published online by Cambridge University Press:  04 August 2017

Andreas Rosenauer ,
Florian Fritz Krause ,
Knut Müller-Caspary ,
Elias Goldmann ,
Frank Jahnke ,
Matthias Paul ,
Michael Jetter ,
Peter Michler ,
Marcus Müller  and
Peter Veit
...Show all authors
Andreas Rosenauer
Affiliation:
Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany
Florian Fritz Krause
Affiliation:
Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany
Knut Müller-Caspary
Affiliation:
Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany
Elias Goldmann
Affiliation:
Institute of Theoretical Physics, University of Bremen, 28359 Bremen, Germany
Frank Jahnke
Affiliation:
Institute of Theoretical Physics, University of Bremen, 28359 Bremen, Germany
Matthias Paul
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Universität Stuttgart, 70569 Stuttgart, Germany,
Michael Jetter
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Universität Stuttgart, 70569 Stuttgart, Germany,
Peter Michler
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Universität Stuttgart, 70569 Stuttgart, Germany,
Marcus Müller
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, 39106 Magdeburg, Germany
Peter Veit
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, 39106 Magdeburg, Germany
Jürgen Christen
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, 39106 Magdeburg, Germany
Tilman Schimpke
Affiliation:
OSRAM Opto Semiconductors GmbH, 93055 Regensburg, Germany
Jan-Philipp Ahl
Affiliation:
OSRAM Opto Semiconductors GmbH, 93055 Regensburg, Germany
Adrian Avramescu
Affiliation:
OSRAM Opto Semiconductors GmbH, 93055 Regensburg, Germany
Martin Strassburg
Affiliation:
OSRAM Opto Semiconductors GmbH, 93055 Regensburg, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1690 - 1691
Copyright
© Microscopy Society of America 2017 

References

[1] Goldmann, E, et al, Applied Physics Letters 105 2014). p. 152102.Google Scholar
[2] Müller, M, et al, Nano Letters 16 2016). p. 5340.Google Scholar
[3] Krause, F F, et al, Ultramicroscopy 156 2015). p. 29.Google Scholar
[4] Müller-Caspary, K, et al, Scientific Reports 6 2016). p. 37146.Google Scholar
[5] Mehrtens, T, et al, Ultramicroscopy 131 2013). p. 1.Google Scholar
[6] Krause, F F, et al, Ultramicroscopy 161 2016). p. 146.Google Scholar
[7] Rosenauer, A, et al, Springer Proceedings in Physics 120 2007). p. 169.Google Scholar