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Microstructure and Electrical Conductivity of (Y, Sr)CoO3-δ Thin Films Tuned by the Film-Growth Temperature

Published online by Cambridge University Press:  04 August 2017

Hongmei Jing ,
Guangliang Hu ,
Shao-Bo Mi ,
Lu Lu ,
Ming Liu ,
Shaodong Cheng ,
Sheng Cheng  and
Chun-Lin Jia
Hongmei Jing
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Guangliang Hu
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Shao-Bo Mi
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, PR China.
Lu Lu
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Ming Liu
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Shaodong Cheng
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Sheng Cheng
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China.
Chun-Lin Jia
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, PR China. State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, PR China. Peter Griinberg Institute and Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Forschungszentrum Julich, D-52425 Julich, Germany.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1656 - 1657
Copyright
© Microscopy Society of America 2017 

Footnotes

*

Electronic address: [email protected]

References

[1] Phelan, D, Louca, D, Rosenkranz, S, et al, Phys. Rev. Lett. 96 2006). p. 027201.Google Scholar
[2] Caciuffo, R, Rinaldi, D & Barucca, G Phys. Rev. B 59 1999). p. 1068.CrossRefGoogle Scholar
[3] Kobayashi, W, Washiwata, S, Terasaki, I, et al, Phys. Rev. B 72 2005). p. 104408.Google Scholar
[4] Hanic, F, Hartmova, M, Knab, G G, et al, Acta Cryst B40 1984). p. 76.Google Scholar
[5] The work was supported by the National Natural Science Foundation of China (Nos. 51471169 and 51390472) and the National Basic Research Program of China (No. 2015CB654903).Google Scholar