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Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method

Published online by Cambridge University Press:  04 August 2017

Yukihito Kondo ,
Kei-ichi Fukunaga ,
Eiji Okunishi  and
Noriaki Endo
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Kei-ichi Fukunaga
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Eiji Okunishi
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Noriaki Endo
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1790 - 1791
Copyright
© Microscopy Society of America 2017 

References

[1] Okunishi, E, et al, Microsc. Microanal. 12(S2 2006). p. 1150.Google Scholar
[2] Kawai, S, et al, Microsc. Microanl 20(S3 2014). p. 1150.CrossRefGoogle Scholar
[3] Kondo, Y & Okunishi, E Microscopy 63(5 2014). p. 391.Google Scholar
[4] Okunishi, E & Kondo, Y Microsc. Microanl 22(S3 2016). p. 264.Google Scholar
[5] Okunishi, E & Kondo, Y European Microscopy Congress 2016: Proceedings 2016). p. 555.Google Scholar
[6] Kondo, Y, et al, European Microscopy Congress 2016: Proceedings 2016). p. 542.Google Scholar