Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T14:37:35.461Z Has data issue: false hasContentIssue false
  • English
  • Français

Interfacial Strain Mapping and Chemical Analysis of Strained-Interface Heterostructures by Nanodiffraction and Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  04 August 2017

William J. Bowman ,
Sebastian Schweiger ,
Reto Pfenninger ,
Ehsan Izadi ,
Amith Darbal ,
Jennifer L.M. Rupp  and
Peter A. Crozier
William J. Bowman
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA Electrochemical Materials Group, ETH Zürich, Switzerland Laboratory for Electrochemical Interfaces, MIT, Cambridge, MA, US
Sebastian Schweiger
Affiliation:
Electrochemical Materials Group, ETH Zürich, Switzerland
Reto Pfenninger
Affiliation:
Electrochemical Materials Group, ETH Zürich, Switzerland Department of Materials Science and Engineering, MIT, Cambridge, MA, USA
Ehsan Izadi
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA
Amith Darbal
Affiliation:
AppFive LLC, Tempe, AZ, USA
Jennifer L.M. Rupp
Affiliation:
Electrochemical Materials Group, ETH Zürich, Switzerland Department of Materials Science and Engineering, MIT, Cambridge, MA, USA
Peter A. Crozier
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1776 - 1777
Copyright
© Microscopy Society of America 2017 

References

[1] Schweiger, S., Kubicek, M., Messerschmitt, F., Murer, F. & Rupp, J.L.M. ACS Nano 8 2014 5032.Google Scholar
[2] Schweiger, S., Pfenninger, R., Bowman, W.J., Aschuauer, U. & Rupp, J.L.M. Adv. Mat. (In press).Google Scholar
[3] Darbal, A., Narayan, R.D., Vartuli, C., Lian, G., et al, Microsc. & Microanal 19(S2 2013 702.CrossRefGoogle Scholar
[4] Bowman, W.J., Schweiger, S., Izadi, E., Darbal, A.D., Rupp, J.L.M. & Crozier, P.A. (In preparation).Google Scholar
[5] We gratefully acknowledge access to the John M. Cowley Center for High Resolution EM and the Southwestern Center for Aberration-Corrected Electron Microscopy at ASU. W.J.B. was a Swiss Government Excellence Scholarship holder for the academic year 2015-2016 (ESKAS No. 2015.1183); he would like to acknowledge financial support of the US NSF’s Graduate Research Fellowship Program (under grant number DGE-1311230), and the US NSF’s Graduate Research Opportunities Worldwide grant. P.A.C. and W.J.B. gratefully acknowledge support of NSF grant DMR-1308085. This work was supported by the Swiss NSF under the project numbers of 155986 (SNSF (ERC) starting grant) and 138914. In particular, we wish to acknowledge Qianlang Liu for her support during operation of the Nion UltraSTEM.Google Scholar