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Nanobeam Scanning Diffraction for Orientation Mapping of Polymers

Published online by Cambridge University Press:  04 August 2017

Karen C. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
Ouliana Panova
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, USA. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA.
X. Chelsea Chen
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA. Department of Chemical and Biomolecular Engineering, University of California, Berkeley, USA.
Christopher J. Takacs
Affiliation:
Photon Sciences, Stanford University, Menlo Park, USA.
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
Nitash P. Balsara
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA. Department of Chemical and Biomolecular Engineering, University of California, Berkeley, USA.
Andrew M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA. Department of Materials Science and Engineering, University of California, Berkeley, USA. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Gammer, C, et al, Ultramicroscopy 155 2015). p. 1.CrossRefGoogle Scholar
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[3] Panova, O, et al, manuscript in preparation.Google Scholar
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[6] Pekin, T, et al Ultramicroscopy, in press.Google Scholar
[7] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. OP, XCC, NPB and AMM acknowledge the Electron Microscopy of Soft Matter Program from the Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division of the U. S. Department of Energy under Contract No. DE-AC02-05CH11231..Google Scholar