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Automated image acquisition and analysis of beam sensitive samples
Published online by Cambridge University Press: 04 August 2017
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1788 - 1789
- Copyright
- © Microscopy Society of America 2017
References
[1]
Battaglia, M, Contarato, D, Denes, P, Doering, D, Giubilato, P, Kim, T S, Mattiazzo, S, Radmilovic, V & Zalusky, S
NuclInstrum Meth A
598
2009). pp. 642–649.Google Scholar
[3]
Callaway, E. (2015, September 9). The revolution will not be crystallized: a new method sweeps through structural biology, Retrieved from www.nature.com.Google Scholar
[4]
Bartesaghi, A, Merk, A, Banerjee, S, Matthies, D, Wu, X, Milne, JLS & Subramaniam, S
Science
348
2015). pp. 1147–1151.CrossRefGoogle Scholar
[6] This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar
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