Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Development of Phase Contrast Scanning Transmission Electron Microscopy

Electron Differential Phase Microscopy with an A-B Effect Phase Plate

Lorentz Transmission Electron Microscopy for Imaging Magnetic Fields from a Perpendicular Ferromagnetic Stripe Domain Thin Film

Fabrication of Self-Supporting Annular Apertures for Use in the Transmission Electron Microscope

A03 Electron Holography for Nanofields in Solids

Abstract

Low Dose Electron Holography: First Steps

A Practically Simple and Easy Approach for Minimizing the Influence of Fresnel Fringes on Phase Sensitivity Measured from Electron Holography

Optimising Electron Holography in the Presence of Partial Coherence and Instrument Instabilities with Conventional and Direct Detection Cameras

Coherent Electron Interference of Diffracted Beams from Amorphous Materials

Three dimensional magnetic field reconstruction of artificial Skyrmion heterostructures

Spin-Multislice Applied to the Electron Spin Interaction with Materials

Nanoscale Strain Mapping in Embedded SiGe Devices by Dual Lens Dark Field Electron Holography and Precession Electron Diffraction

Strain Measurement through the Thickness of Crystal using DBI

Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations

Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography

Crystalline Phase Mapping Associated to the Magnetic Flux in Cobalt Nanowires

New Quantitative Phase Reconstruction Technique using Hollow-cone Probe and Annularly Arrayed Detectors in STEM

Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM

Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Progression of Focused Helium Ion Beam Milling in Gold Substrates

Investigation of Ar Ion-Milling Rates for Transmission Electron Microscopy Specimens

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A03 Electron Holography for Nanofields in Solids

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract