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Development of Phase Contrast Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

H. Iijima ,
H. Minoda ,
T. Tamai ,
Y. Kondo ,
T. Fukuda  and
F. Hosokawa
H. Iijima
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
H. Minoda
Affiliation:
Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
T. Tamai
Affiliation:
Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
Y. Kondo
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
F. Hosokawa
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1943 - 1944
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Danev, R. & Nagayama, K., J. Phys. Sci. Jpn 70 (2001). p 696.Google Scholar