Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

STEM in 4 Dimensions: Using Multivariate Analysis of Ptychographic Data to Reveal Material Functionality

Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector *

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy

Introducing Nano-FTIR - Imaging and Spectroscopy at 10nm Spatial Resolution

New Hybrid Peak-Force Tapping/Near-Field Microscope for Nano-Chemical and Nano-Mechanical Imaging of Graphene Plasmons, Polymers and Proteins

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Electron Microprobes and SEMs

Evaluation of Combined Quantification of Cr-Ni Steel using EDS and WDS

Comparison of WDS and EDS Rare Earth Element Analysis

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential

Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy using μSTEM

Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy

Propagation of Bessel Beams along Atomic Columns in Crystal: a Bloch Wave and Multi-slice Analysis

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction

Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

Certified Reference Material for Strain Measurement Using EBSD

Novel Applications of Electron Channeling Contrast Imaging

Advances in HREBSD for Elastic Strain Measurement and its Application to Mechanical Testing

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Valence-loss EELS Spectroscopy of Refractory Plasmonic Nanomaterials

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract