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Novel Applications of Electron Channeling Contrast Imaging

Published online by Cambridge University Press:  23 September 2015

Julia I. Deitz ,
Santino D. Carnevale ,
David W. McComb ,
Steven A. Ringel  and
Tyler J. Grassman
Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA
Santino D. Carnevale
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA Institute for Materials Research, The Ohio State University, Columbus, OH, 43210, USA
David W. McComb
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA
Steven A. Ringel
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA Institute for Materials Research, The Ohio State University, Columbus, OH, 43210, USA
Tyler J. Grassman
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA Institute for Materials Research, The Ohio State University, Columbus, OH, 43210, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1897 - 1898
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Carnevale, S., Deitz, J., et al, Appl. Phys. Lett. 104 (2014). p 232111.Google Scholar
[2] Quitoriano, N. J. & Fitzgerald, E. A., J. Appl. Phys. 102 (2007), p. 033511.CrossRefGoogle Scholar