Microscopy and Microanalysis: Volume 21 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 21 - August 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Role of Fluid-Mediated Interactions in Guiding Nanoparticle Assembly

The Two Dimensional Nanoplate Dynamics Revealed by in situ Liquid Cell TEM

Dynamic studies of solution-based reactions using operando TEM

Precision In Situ Control of Local Liquid Chemistry via Electron Irradiation

Probing Nanoparticle Dynamics in 200 nm Thick Liquid Layers at Millisecond Time Resolution

Bonding Pathways of Gold Nanocrystals in Solution

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy

In Situ Analysis of the Fracture Behavior of Nanocrystalline Copper Using Precession-Assisted Crystal Orientation Mapping

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

Observation of the Potential Distribution in GaN-Based Devices by a Scanning Electron Microscope

Denickelification and Dezincification of Copper Alloys in Water Environments

Application of EFTEM and XEDS Elemental Mapping to Characterization of Nanometer Devices in Semiconductor Wafer-Foundries

Isolating the Photocatalytic Degradation of Methylene Blue Dye on TiO2 Surface

Influence of Hydrogen on Fracture Mode API X60 Steel

Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications

Microscopic Origin of Strength and Microhardness of Titanium Alloy at Elevated Temperature

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract

Microstructural Properties of Piezoelectric 0.95(Naoo5Bioo5TiO3)-0.05(BaTiO3) Thin Films on SrTiO3 (001) Substrates

TEM Study of Nano Crystals in Li2O-Al2O3-SiO2 Glass-Ceramics

A New Method to Characterize Non-oxide Thin Film Uniformity at Device Level using Electron Energy Loss Spectroscopy

The Influence of pH Buffer as Agent Reaction Moderator in the Growth of CdS/ZnS Films by CBD Technique for Solar Cell Applications

Pressure Effect on the Deposition in the a-Si:H Films by PECVD Process for Solar Cell Applications

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 21 - August 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract