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Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

James L. Hart
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia PA, US
Miryam Arredondo
Affiliation:
School of Mathematics and Physics, Queens University, Belfast Northern Ireland, UK
Mitra L. Taheri
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia PA, US

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[4] Cazaux, J., Ultramicroscopy 60 (1995) 411425.Google Scholar