Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Vendor Symposium

Data Management by ZEISS

The Benefits of Plasma Cleaning for TKD/EBSD Analysis

Plasma Cleaning with Alternate Gases

Tungsten Probe Tip Cleaning

Fixturing Options for Atom Probe Tomography

Novel Workflow for Improved Throughput, Turnaround Time, and Cross Section Preparation of Microelectronic Devices

Development of Dark-Field Photonic Scanning Transmission Electron Microscopy (DFP-STEM)

High Speed SEM Elemental Mapping with Micro-XRF-EDS

High-resolution Nano-imaging with Transmission Nanofocus X-ray Source

“Integrated EPMA” with New Multifunction Technology

Automation of TEM Optical Alignments

Extreme In Situ Mechanics of Bond Coatings and Ni-based Superalloys Using an Advanced SEM Nanomechanical Instrument

The Promise of Cryo-Electron Tomography

3D Visualization of Neurites in Mouse Primary Hippocampal Neuron Cultures Using Cryo-Electron Tomography

Automated Cryo-plunging Robot to Prepare Samples for Single Particle Analysis (SPA), Cryo-EM, Cryo-ET, Cryo-fluorescence and Cryo-CLEM

In Situ Investigations of the Bacterial Type II Secretion System

Comparing EM Approaches for Studying Filoviral Glycoproteins

Microbes in Focus

Obstacle-induced Branching in Filamentous Fungi

Structure of the Shigella flexneri podophage HRP29

Analysis of Mineralized Matrices in Calcium Bodies with and Without Bacteria in Two Species of Terrestrial Crustaceans

Correlative and Multimodal Microscopy and Imaging of Physical, Environmental, and Biological Sciences

Hyperspectral Imaging as a Tool to Detect and Characterize Nanoparticles in Complex Biofluids

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Vendor Symposium

The Promise of Cryo-Electron Tomography

Microbes in Focus

Correlative and Multimodal Microscopy and Imaging of Physical, Environmental, and Biological Sciences