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The Benefits of Plasma Cleaning for TKD/EBSD Analysis

Published online by Cambridge University Press:  30 July 2020

Barbara Armbruster ,
Michael Cable ,
Ewa Kosmowska ,
Kim Larsen ,
Patrick Trimby  and
Ronald Vane
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, California, United States
Michael Cable
Affiliation:
XEI Scientific, Inc., Redwood City, California, United States
Ewa Kosmowska
Affiliation:
XEI Scientific, Inc., Redwood City, California, United States
Kim Larsen
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, Bucks, England, United Kingdom
Patrick Trimby
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, Bucks, England, United Kingdom
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, California, United States

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2702 - 2703
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Copyright
Copyright © Microscopy Society of America 2020

References

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