Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Grain Analysis of Atomic Force Microscopy Images via Topological Data Analysis

Development of Clustering Algorithm Applied for the EELS Analysis of Advanced Devices

AI-based Feature Detection in X-ray-CT Images Using Synthesized Data

The Atomic Structure of Epitaxial Metallic Transition Metal Nitride TaNx by STEM-ABF and HAADF

Experiments in Astigmatism Detection and Correction Techniques for the SEM

Bayesian Microscopy: Model Selection for Extracting Weak Nonlinearities from Scanning Probe Microscopy Data

Enforcing Prediction Consistency Across Orthogonal Planes Significantly Improves Segmentation of FIB-SEM Image Volumes by 2D Neural Networks.

Improving Primary Ciliary Dyskinesia Diagnosis Using Artificial Intelligence

Mapping the Distortion Function via Multivariate Analysis of Atomically Resolved Images

Direct Phase Imaging with Coherent Electron Beam in TEM

Determining the Chirality of Néel-type Magnetic Skyrmions by Phase Retrieval with Four-dimensional Lorentz Scanning Transmission Electron Microscopy

Homochiral Skyrmionic Bubbles in Exfoliated 2D Van Der Waals Cr2Ge2Te6

Automated Acquisition and High-precision Phase Analysis of Vast Numbers of Electron Holograms of Nanoparticles

Hollow-cone Foucault Imaging of Magnetic Microstructures in Large Magnetostrictive FeGa Alloy

Design for a New “Dipole-sorter” for Direct and Dose Effective Magnetic Dipole Measurement

Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

Double-Slit Electron Interference Experiment with Phase Modulation

Characterization of Combustion Synthesis of Ferromagnetic FeAl2O4 spinel

On the Benefit of Aberration Correction in Cryo Electron Microscopy

Applications of Phase-Contrast STEM as Dose Efficient Method for High-resolution Imaging of Soft Materials

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

A New Kakanui Hornblende for Use by EPMA Labs

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Direct Phase Imaging with Coherent Electron Beam in TEM

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)