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Mapping the Distortion Function via Multivariate Analysis of Atomically Resolved Images

Published online by Cambridge University Press:  30 July 2020

Kevin Roccapriore ,
Matthew Chisholm ,
Gerd Duscher ,
Sergei Kalinin  and
Maxim Ziatdinov
Kevin Roccapriore
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Matthew Chisholm
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Gerd Duscher
Affiliation:
The University of Tennessee Knoxville, Knoxville, Tennessee, United States
Sergei Kalinin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Maxim Ziatdinov
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2134 - 2135
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Copyright
Copyright © Microscopy Society of America 2020

References

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Ophus, C., Ciston, J. & Nelson, C. T. Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions. Ultramicroscopy 162, 1–9 (2016).10.1016/j.ultramic.2015.12.002CrossRefGoogle ScholarPubMed
Rasmussen, C. E. Gaussian Processes in Machine Learning. in Advanced Lectures on Machine Learning: ML Summer Schools 2003, Canberra, Australia, February 2 - 14, 2003, Tübingen, Germany, August 4 - 16, 2003, Revised Lectures (eds. Bousquet, O., von Luxburg, U. & Rätsch, G.) 63–71 (Springer, 2004). doi:10.1007/978-3-540-28650-9_4.Google Scholar