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Automated Acquisition and High-precision Phase Analysis of Vast Numbers of Electron Holograms of Nanoparticles

Published online by Cambridge University Press:  30 July 2020

Yoshio Takahashi ,
Tetsuya Akashi ,
Atsuko Sato ,
Toshiaki Tanigaki ,
Hiroyuki Shinada  and
Yasukazu Murakami
Yoshio Takahashi
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Tetsuya Akashi
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Atsuko Sato
Affiliation:
Kyushu University, Fukuoka, Fukuoka, Japan
Toshiaki Tanigaki
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Hiroyuki Shinada
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Yasukazu Murakami
Affiliation:
Kyushu University, Fukuoka, Fukuoka, Japan

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2142 - 2145
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Copyright
Copyright © Microscopy Society of America 2020

References

Takahashi, Y. et al. , Microscopy (2020), DOI: 10.1093/jmicro/dfaa004.Google ScholarPubMed
Akashi, T. et al. , Appl. Phys. Lett., 106 (2015) 074101.10.1063/1.4908175CrossRefGoogle Scholar
Popescu, R. et al. , Phys. Rev. B76 (2007) 235411.10.1103/PhysRevB.76.235411CrossRefGoogle Scholar
This work was supported by JST CREST Grant Number JPMJCR 1664, Japan.Google Scholar