Materials Applications
Microfluorescence Analysis of Nanostructuring Inhomogeneity in Optical Fibers with Embedded Gallium Oxide Nanocrystals
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- 21 March 2012, pp. 259-265
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Three-Dimensional Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam–Scanning Electron Microscopy
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- 01 February 2012, pp. 266-271
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Microstructural Characterization of Next Generation Nuclear Graphites
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- 23 January 2012, pp. 272-278
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Biological and Biomedical Applications
Characterization of Micro- and Nanophase Separation of Dentin Bonding Agents by Stereoscopy and Atomic Force Microscopy
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- 03 February 2012, pp. 279-288
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Scanning Electron Microscopy and Roughness Study of Dental Composite Degradation
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- 13 February 2012, pp. 289-294
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Microstructural Evaluation of Boron Free and Boron Containing Heat-Treated Ti-35Nb-7.2Zr-5.7Ta Alloy
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- 02 March 2012, pp. 295-303
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Bee (Apis mellifera) Venom Produced Toxic Effects of Higher Amplitude in Rat Thoracic Aorta than in Skeletal Muscle—An Ultrastructural Study
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- 21 March 2012, pp. 304-316
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Alterations in the Fat Body Cells of Rhinocricus padbergi (Diplopoda) Resulting from Exposure to Substrate Containing Sewage Sludge
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- 08 February 2012, pp. 317-323
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Bioconjugated and Cross-Linked Bionanostructures for Bifunctional Immunohistochemical Labeling
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- 13 March 2012, pp. 324-330
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A Negative Stain for Electron Microscopic Tomography
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- 27 February 2012, pp. 331-335
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Techniques and Software Development
Fully Automated Measurement of the Modulation Transfer Function of Charge-Coupled Devices above the Nyquist Frequency
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- 14 February 2012, pp. 336-342
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Variable Phase Dark-Field Contrast—A Variant Illumination Technique for Improved Visualizations of Transparent Specimens
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- 02 March 2012, pp. 343-352
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Calibration of Piezoelectric Positioning Actuators Using a Reference Voltage-to-Displacement Transducer Based on Quartz Tuning Forks
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- 21 March 2012, pp. 353-358
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A New Approach to the Determination of Concentration Profiles in Atom Probe Tomography
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- 03 February 2012, pp. 359-364
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Possibility of Scanning Electron Microscope Observation and Energy Dispersive X-Ray Analysis in Microscale Region of Insulating Samples Using Diluted Ionic Liquid
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- 27 February 2012, pp. 365-370
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Dependence of the Electron Beam Energy and Types of Surface to Determine EBSD Indexing Reliability in Yttria-Stabilized Zirconia
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- 16 February 2012, pp. 371-378
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Improved Focused Ion Beam Target Preparation of (S)TEM Specimen—A Method for Obtaining Ultrathin Lamellae
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- 21 March 2012, pp. 379-384
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Highly Reproducible Secondary Electron Imaging under Electron Irradiation Using High-Pass Energy Filtering in Low-Voltage Scanning Electron Microscopy
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- 27 February 2012, pp. 385-389
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Dimensional Quantification of Embedded Voids or Objects in Three Dimensions Using X-Ray Tomography
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- 03 February 2012, pp. 390-398
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Improved Signal-to-Noise Ratio in Laboratory-Based Phase Contrast Tomography
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- 30 January 2012, pp. 399-405
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