In this paper we describe the capabilities for texture measurements of the new neutron time-of-flight diffractometer HIPPO at the Los Alamos Neutron Science Center. The orientation distribution function (ODF) is extracted from multiple neutron time-of-flight histograms using the full-pattern analysis first described by Rietveld. Both, the well-established description of the ODF using spherical harmonics functions and the WIMV method, more recently introduced for the analysis of time-of-flight data, are available to routinely derive the ODF from HIPPO data. At ambient conditions, total count time of less than one hour is ample to collect sufficient data for texture analysis in most cases. The large sample throughput for texture measurements at ambient conditions possible with HIPPO requires a robust and reliable, semi-automated data analysis. HIPPO’s unique capabilities to measure large quantities of ambient condition samples and to measure texture at temperature and uni-axial stress are described. Examples for all types of texture measurements are given

Six A-type zeolites: NaA, MnNaA, CoNaA, NiNaA, ZnNaA, CdNaA have been characterized by X-ray powder diffraction. The zeolites with selected divalent cations have been synthesized by a very careful ion-exchange process using very high quality NaA zeolite. Experimental 2θ peak positions, relative peak intensities, values of d and Miller indices as well as a unit cell parameter are reported.

X-ray powder diffraction data for a new calcium zirconium phosphate Ca7Zr(PO4)6 are reported. The sample was prepared by heating mixtures of CaCO3, ZrO2, and NH4H2PO4 in prescribed molar ratios at 1623 K. Powder diffraction data were collected with a laboratory X-ray source (Cu Kα) for refinement of unit-cell parameters and intensity measurement of individual reflections. Crystallographic data were Ca7Zr(PO4)6, cubic, I-43d (No. 220), a=0.98338(1) nm, V=0.95097(3) nm3, Z=2, and Dx=3.29 Mg m−3. This compound is most probably isomorphous with eulytite.

The X-ray powder diffraction patterns for three 4-tert-butylcalix(4)arenes were determined. The similarity and differences between them were compared and discussed.

Stress in the early stages of growth has been measured in α-Al2O3 (alumina) scales formed on FeCrAl- and NiAl-based alloys during heating in air at 1000 °C to 1200 °C. Scale thickness ranges from 0.5 to 5 μm, times from 5 to 720 min. Stress was measured using the multiple-tilt method. In order to measure the thinnest scales at the earliest times, focused, monochromatic synchrotron radiation was used for high intensity, and a fixed, small angle of incidence was used along with an appropriate wavelength to maximize scattering from the film relative to the background from the substrate. Depending on the composition, transient tensile stresses of up to 1.2 GPa were observed, with maximum stress at times ranging from >10 h at 1000 °C to <10 min at 1200 °C. Thermal stresses induced by an abrupt temperature change were found to relax much more quickly, suggesting that the kinetics observed during isothermal growth reflect a dynamic competition between stress generation and stress relaxation. These results challenge commonly accepted models of growth stress in scales that predict that a compressive stress will be generated as the metal converts to a larger-volume oxide in a constrained location such as an interface. The observed tensile stress may be due to another mechanism altogether (e.g., grain coalescence), or to the conversion of a transitional Al2O3 to the equilibrium α-Al2O3 phase. For one composition, transitional Al2O3 is observed during the period of tensile stress

Elevated-temperature X-ray diffraction (XRD) was used to evaluate residual stresses in aluminum thin films on Si(100). The films with a thickness of 2 μm were deposited by magnetron sputtering at different temperatures, and XRD measurements were carried out with the heating stage DHS 900 mounted on a Seifert 3000 PTS diffractometer. The strains were characterized always in temperature cycles from room temperature up to 450 °C with steps of 50 °C. Stress values in weakly textured thin films were calculated using the Hill model, applying temperature-dependent X-ray elastic constants of aluminum. The thin films exhibit specific temperature hysteresis of stresses depending on the deposition temperature (being from the range of 50 °C–300 °C). The results allow us to quantify contributions of intrinsic and extrinsic stresses to the total stress in the layers as well as to evaluate phenomena related to plastic yield. The comparison of the data from thin films deposited at different temperatures indicate a dependence of intrinsic stresses on the substrate temperature during deposition as well as the presence of the plastic yield in films during the cool-down after deposition

The X-ray fluorescence holography (XFH) method has drawn the attention of many researchers as a novel experimental technique for imaging a three-dimensional local atomic structure around a certain element in a single crystal. Synchrotron radiation (SR) has been mainly used for the measurements because of extremely weak signals that are about 0.3% of isotropic fluorescent radiation. The measurements limited to the use of a SR source clearly hinder from increasing the number of the users. Thus, we developed a laboratory XFH equipment with a conventional X-ray source by using a singly bent graphite monochromator with a large curvature and X-ray detector for a high counting rate. With this equipment, we have successfully demonstrated that high-quality hologram data of a gold single crystal almost equivalent to those with a SR source are obtained. Four different holograms are recorded in the normal and inverse XFH modes. An atomic image reconstructed from these holograms patterns shows a distinct atomic image of Au

Total reflection X-ray fluorescence analysis (TXRF) using monochromatized undulator radiation in the PTB radiometry laboratory at the synchrotron radiation facility BESSY II has been employed to investigate the chemical state of nitrogen compounds in aerosols. The aerosol samples of different size fractions were deposited on silicon wafer surfaces in a May impactor. Using a thin window Si(Li) detector, TXRF detection limits for nitrogen are in the upper fg and lower pg range. Taking advantage of the tunability of monochromatized undulator radiation, the near edge X-ray absorption fine structure (NEXAFS) could be combined with TXRF analysis, allowing for the speciation of the aerosols at the nitrogen K absorption edge. Such low detection limits enable an analysis of aerosol samples taken in 10 min with acceptable accuracy. Applicability of the technique to real aerosol samples has been used to compare nitrogen oxidation state in suburban and rural aerosols

Preparing dry specimens from liquid samples for XRF analysis avoids introducing caustic or hazardous liquids into the instrument. Several modifications were made to a dried residue specimen preparation method for quantifying gallium in plutonium metal in order to improve the method accuracy and precision. Ion exchange chromatography was utilized to remove the plutonium prior to casting the dried residue specimens. This, coupled with several other changes, improved the method relative error from ∼5% to less than 1%. These results are sufficient for routine sample analysis and are almost comparable to results from the established process using liquid specimens. However, the analysis of radioactive liquid specimens is unnecessary for quantifying the plutonium gallium content using this dried residue approach