Powder Diffraction: Volume 19 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 19 - Issue 2 - June 2004

Contents

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Denver X-Ray Conference

D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited
I. C. Noyan
Published online by Cambridge University Press:

20 May 2016, p. 203
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D-65 A Review of Compact, Low-Power, On-Line, Diffraction-Based Analyzers—Invited
H. Huang, W. M. Gibson
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20 May 2016, p. 203
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D-32 X-ray Microdiffraction Studies of Corrosion Scales in Old Iron/Steel Drinking Water Distribution Pipes
P. Sarin, V. L. Snoeyink, W. M. Kriven, D. Hay
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20 May 2016, p. 203
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D-62 X-ray Microdiffraction Study of Indentation Induced Fracture in Single Crystal BaTiO3
R. C. Rogan, E. Üstündag, M. A. Brown, N. Tamura
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20 May 2016, p. 203
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F-2 Micro X-ray Fluorescence Imaging of Pharmaceutical Tablet Formulations
T. C. Miller, G. J. Havrilla
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20 May 2016, p. 203
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F-6 A Novel Application of Pulsed X-ray in Laser Matter Interaction
F. A. Selim, D. P. Wells, J. F. Harmon
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20 May 2016, p. 203
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F-17 Detection of Latent Human Fingerprints by Micro-X-ray Fluorescence
C. G. Worley, S. S. Wiltshire, T. C. Miller, G. J. Havrilla, V. Majidi
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20 May 2016, p. 203
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F-30 Confocal X-ray Fluorescence Microscope
G. J. Havrilla, N. Gao
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20 May 2016, p. 203
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F-50 Elemental Distribution in Various Areas of Human Articular Bones by SR μ-XRF
N. Zoeger, P. Wobrauschek, C. Streli, C. Jokubonis, G. Pepponi, P. Roschger, G. Falkenberg, W. Osterode
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20 May 2016, p. 203
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D-117 Parallel Beam XRD: High Accuracy Data from Powders and Polycrystalline Thin Films—Invited
D. K. Bowen
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20 May 2016, p. 203
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D-34 Fundamental Parameters Fitting of XRPD Data Measured Using Multilayer Optics
S. T. Misture, M. D. Dolan
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20 May 2016, p. 204
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D-113 Phase Transformation Textures in Ti-6AI-4V alloy
S. C. Vogel, D. J. Williams, D. Bhattacharyya, G. B. Viswanathan, H. L. Fraser
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20 May 2016, p. 204
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D-83 Powder Diffraction Analysis of Hydraulic Cements: ASTM Rietveld Round Robin for Precision and Bias
P. Stutzman
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20 May 2016, p. 204
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D-59 Investigation of Reaction Kinetics in Ceramic Systems Using High-Temperature X-ray Diffraction
M. D. Dolan, S. T. Misture
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20 May 2016, p. 204
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D-50 Parallel Beam Geometry After the Hype
M. Fransen
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20 May 2016, p. 204
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D-77 Towards Fast Reciprocal Space Mapping
J. F. Woitok, A. Kharchenko
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20 May 2016, p. 204
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D-98 Strategies for Parallel Beam Diffraction Analysis of Mesoporous Thin Films
K. Macchiarola, C. Reiss, B. Kinneging
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20 May 2016, p. 204
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D-103 Accurate Determination of Organic Crystal Structures from Powder Diffraction Data—Invited
W. I. F. David
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20 May 2016, p. 204
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D-111 Crystal Chemistry and Energetics of New NaNb03—Based Perovskites—Invited
H. Xu, A. Navrotsky, Y. Su, M. L. Balmer
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20 May 2016, p. 204
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D-71 BaF2 Process of Long-Length Conductors: High-Temperature Neutron and X-ray Study of YOF
W. Wong-Ng, I. Levin, Q. Huang, L. P. Cook
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20 May 2016, p. 204
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Page 6 of 7

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2
3
4
5
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Powder Diffraction

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Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference

D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited

D-65 A Review of Compact, Low-Power, On-Line, Diffraction-Based Analyzers—Invited

D-32 X-ray Microdiffraction Studies of Corrosion Scales in Old Iron/Steel Drinking Water Distribution Pipes

D-62 X-ray Microdiffraction Study of Indentation Induced Fracture in Single Crystal BaTiO3

F-2 Micro X-ray Fluorescence Imaging of Pharmaceutical Tablet Formulations

F-6 A Novel Application of Pulsed X-ray in Laser Matter Interaction

F-17 Detection of Latent Human Fingerprints by Micro-X-ray Fluorescence

F-30 Confocal X-ray Fluorescence Microscope

F-50 Elemental Distribution in Various Areas of Human Articular Bones by SR μ-XRF

D-117 Parallel Beam XRD: High Accuracy Data from Powders and Polycrystalline Thin Films—Invited

D-34 Fundamental Parameters Fitting of XRPD Data Measured Using Multilayer Optics

D-113 Phase Transformation Textures in Ti-6AI-4V alloy

D-83 Powder Diffraction Analysis of Hydraulic Cements: ASTM Rietveld Round Robin for Precision and Bias

D-59 Investigation of Reaction Kinetics in Ceramic Systems Using High-Temperature X-ray Diffraction

D-50 Parallel Beam Geometry After the Hype

D-77 Towards Fast Reciprocal Space Mapping

D-98 Strategies for Parallel Beam Diffraction Analysis of Mesoporous Thin Films

D-103 Accurate Determination of Organic Crystal Structures from Powder Diffraction Data—Invited

D-111 Crystal Chemistry and Energetics of New NaNb03—Based Perovskites—Invited

D-71 BaF2 Process of Long-Length Conductors: High-Temperature Neutron and X-ray Study of YOF

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Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference