Powder Diffraction: Volume 19 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 19 - Issue 2 - June 2004

Contents

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Denver X-Ray Conference

D-3 SAXSess—An Analytical Tool for Nanostructured Materials
H. Schnablegger, A. Bergmann, O. Glatter
Published online by Cambridge University Press:

20 May 2016, p. 196
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D-15 Crystalline or Liquid Crystalline? A XRD Study on Octasubstituted Discotic Phthalocyanines
W. Xia, B. A. Minch, M. D. Carducci, N. R. Armstrong
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20 May 2016, p. 196
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F-47 Quantitative Procedures in TXRF—Invited
P. Wobrauschek
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20 May 2016, p. 196
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F-25 Advanced Pulse Processing and Analytical Methods for Quantitative Energy Dispersive XRF and Micro-EDXRF—Invited
J. A. Nicolosi, R. B. Shen, B. Scruggs, W. T. Elam, M. Solazzi
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20 May 2016, p. 196
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F-19 Development of a Monte Carlo—Library Least-Squares (MCLLS) Code Package for the EDXRF Inverse Problem—Invited
R. P. Gardner, W. Guo
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20 May 2016, p. 196
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F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters
W. T. Elam, R. B. Shen, B. Scruggs, J. Nicolosi
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20 May 2016, p. 196
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F-5 The Role of Standards Australia in Achieving and Maintaining Accuracy and Precision in Lithium Borate Fusion—XRF Spectrometric Analysis
J. G. H. Metz
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20 May 2016, p. 196
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F-36 Quantitative Analysis of Single Particles by Combination of X-ray Microanalysis and Monte Carlo Simulations
J. Osán, S. Török, L. Vincze
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20 May 2016, p. 196
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C-7 A New Ultra Fast and Low Noise X-ray Detector System—Invited
K. Omote, A. Tsukiyama, M. Kuraibayashi, T. Saito
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20 May 2016, p. 197
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C-8 Modelling the Response of Silicon X-ray Detectors
T. Eggert
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20 May 2016, p. 197
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C-4 Improving Energy Stability in the NIST Microcalorimeter X-ray Detector
T. Jach, J. A. Small, D. E. Newbury
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20 May 2016, p. 197
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F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy
H. Soltau, P. Lechner, G. Lutz, L. Strüder, C. Fiorini, A. Longoni
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20 May 2016, p. 197
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F-10 Large Area Silicon Drift Detectors for XRF Applications
O. Boslau, T. Eggert, P. Goldstraϐ, J. Kemmer
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20 May 2016, p. 197
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D-49 The Influence of X-ray Tube and Detector Settings on the Peak-to-Background Ratio of the Powder Diffractogram
M. J. Fransen
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20 May 2016, p. 197
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D-31 High-Resolution Synchrotron Radiation XRD and Microstructure Imaging in 6-DIM Orientation-Location Space by the Moving Area Detector Method—Invited
L. Wcislak, H. J. Bunge, H. Klein, U. Garbe, J. R. Schneider
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20 May 2016, p. 197
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D-8 Materials Science Applications of the Three Dimensional X-ray Diffraction Microscope
L. Margulies, S. Schmidt, E. M. Lauridsen, H. F. Poulsen, D. Juul Jensen, A. Kvick
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20 May 2016, p. 197
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D-116 Texture of Nisi Films on Single Crystal Silicon—Invited
C. Detavernier, C. Lavoie
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20 May 2016, p. 198
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D-63 High Energy X-ray Diffraction Investigation of the Ferroelectric Behavior of (Pb,La)(Zr,Ti)O3
R. C. Rogan, E. Üstündag, M. R. Daymond, U. Lienert
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20 May 2016, p. 198
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D-64 In-Situ Study of Oxide Growth on a Kanthal Alloy
E. Üstündag, J. D. Almer, J. Nychka, D. R. Clarke
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20 May 2016, p. 198
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D-105 Transient Stress Effects in Thin Films Determined by X-ray Diffraction—Invited
C. E. Murray
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20 May 2016, p. 198
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Page 3 of 7

First
« Prev
1
2
3
4
5
6
7
Next »
Last

Powder Diffraction

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Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference

D-3 SAXSess—An Analytical Tool for Nanostructured Materials

D-15 Crystalline or Liquid Crystalline? A XRD Study on Octasubstituted Discotic Phthalocyanines

F-47 Quantitative Procedures in TXRF—Invited

F-25 Advanced Pulse Processing and Analytical Methods for Quantitative Energy Dispersive XRF and Micro-EDXRF—Invited

F-19 Development of a Monte Carlo—Library Least-Squares (MCLLS) Code Package for the EDXRF Inverse Problem—Invited

F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters

F-5 The Role of Standards Australia in Achieving and Maintaining Accuracy and Precision in Lithium Borate Fusion—XRF Spectrometric Analysis

F-36 Quantitative Analysis of Single Particles by Combination of X-ray Microanalysis and Monte Carlo Simulations

C-7 A New Ultra Fast and Low Noise X-ray Detector System—Invited

C-8 Modelling the Response of Silicon X-ray Detectors

C-4 Improving Energy Stability in the NIST Microcalorimeter X-ray Detector

F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy

F-10 Large Area Silicon Drift Detectors for XRF Applications

D-49 The Influence of X-ray Tube and Detector Settings on the Peak-to-Background Ratio of the Powder Diffractogram

D-31 High-Resolution Synchrotron Radiation XRD and Microstructure Imaging in 6-DIM Orientation-Location Space by the Moving Area Detector Method—Invited

D-8 Materials Science Applications of the Three Dimensional X-ray Diffraction Microscope

D-116 Texture of Nisi Films on Single Crystal Silicon—Invited

D-63 High Energy X-ray Diffraction Investigation of the Ferroelectric Behavior of (Pb,La)(Zr,Ti)O3

D-64 In-Situ Study of Oxide Growth on a Kanthal Alloy

D-105 Transient Stress Effects in Thin Films Determined by X-ray Diffraction—Invited

Powder Diffraction

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Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference