Atom probe tomography. APT has become a versatile tool to address fundamental questions in materials science and for practical materials analysis. This issue focuses on recent developments and the broadening range of materials classes and applications studied using APT. The cover shows an APT tip, with the sample composed of small Ag-rich precipitates embedded in an Al crystalline matrix. The tip, defined by geometric features (tip radius and angle of the shaft), is at a certain distance from the detector in a straight flight path configuration. Evaporated atoms are projected from the tip surface position to the detector position, which records this information atom by atom. The chemical identity of the ions is determined by their time of flight. The specimen volume is thus reconstructed. See the technical theme that begins on page 13.
Contents
Society News
News
MSE 2016 to be held September 27–29 in Germany: www.mse-congress.de
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- 08 January 2016, p. 71
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NICE 2016 International Conference to be held October 16–19 in France: www.nice2016-conference.com
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Features
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Exploring Materials through Patent Information David Segal: Royal Society of Chemistry, 2014 266 pages, $38.90 ISBN 978-1-78262-112-6
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- 08 January 2016, p. 72
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Physics, Curiosities, Oddities, and Novelties John Kimball: CRC Press, 2015 380 pages, $34.95 ISBN 978-1-4665-7635-3
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- 08 January 2016, pp. 72-73
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Material Alchemy Jenny Lee: BIS Publishers, 2015 152 pages, $26.81 ISBN 978-9063693763
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Posterminaries
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Did materials science fall into a black hole in Interstellar?
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- 08 January 2016, pp. 79-80
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Career Central
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CAREER CENTRAL
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- 08 January 2016, pp. 74-78
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Front Cover (OFC, IFC) and matter
MRS volume 41 issue 1 Cover and Front matter
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- 08 January 2016, pp. f1-f6
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Back Cover (OBC, IBC) and matter
MRS volume 41 issue 1 Cover and Back matter
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- 08 January 2016, pp. b1-b2
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