Microscopy and Microanalysis: Volume 22 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

Beyond Movie Mode: Bridging the Gap of Time Resolution

Pump-Probe and Time-Resolved Electron Microscopy and Big Data Analysis of Electron-Lattice Dynamics in Strongly Correlated Electron Systems

Local strain measurements during in situ TEM deformation with nanobeam electron diffraction

Probing Stress-Induced Grain Boundary Migration and Hypofriction at High Resolution

Structural Dynamics of Supported Metal Nanoparticles

Recent Advancement of Environmental TEM for Material Process Characterization

Automated Image Processing Scheme to Measure Atomic-Scale Structural Fluctuations

Fast Atomic-Scale Chemical Imaging by STEM EDS for Study of Crystalline Materials and Dynamic Phase Transformations

Atomic ScaleIn SituElectron Microscopy: Challenges and Opportunities

Increasing the Dimensionality of In-situ Electron Microscopy Data Sets by On-the-fly and Analytical Electron Tomography

Transmission Electron Microscopy at Atmospheric Pressure

Environmental TEM Studies of CoMn nanoalloys as Model Fischer-Tropsch Catalysts

Design and Application of anIn SituIllumination System for an Aberration-corrected Environmental Transmission Electron Microscope

The synergic effect of atomic hydrogen and catalyst spreading on Ge nanowire growth orientation and kinking

Visualization of Phase Segregation and Surface Reconstruction of Pt-Based Bi-metallic Clusters DuringIn SituOxidation

Monitoring the Dynamics of Heterogeneous Catalysts by Electron Microscopy

Operando Electron Microscopy of Catalysts

Data Analytics Applied to Chemical Transformations in Liquids

Liquid Cell TEM Study of Nanoparticle Diffusion and Interaction in Liquids

Direct Observation of the Growth of Au-Pd Core-Shell Nanoparticles Using Low-Dose STEM with the Liquid Cellin situ

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract