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Automated Image Processing Scheme to Measure Atomic-Scale Structural Fluctuations

Published online by Cambridge University Press:  25 July 2016

Zahra Hussaini ,
Pin Ann Lin ,
Wenhui Zhu ,
Bharath Natarajan  and
Renu Sharma
Zahra Hussaini
Affiliation:
Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
Pin Ann Lin
Affiliation:
Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, USA Maryland NanoCenter, University of Maryland, College Park, Maryland, USA
Wenhui Zhu
Affiliation:
Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, USA Department of Mechanical Engineering & Multidisciplinary Program in Materials Science and Engineering, State University of New York, Binghamton, NY, USA
Bharath Natarajan
Affiliation:
Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, USA Maryland NanoCenter, University of Maryland, College Park, Maryland, USA
Renu Sharma
Affiliation:
Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 718 - 719
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Hansen, , et al., Science 294 (2001). p. 1508.Google Scholar
[3] Picher, , et al, Ultramicroscopy 150 (2015). p. 10.Google Scholar