Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T16:53:38.456Z Has data issue: false hasContentIssue false
  • English
  • Français

Increasing the Dimensionality of In-situ Electron Microscopy Data Sets by On-the-fly and Analytical Electron Tomography

Published online by Cambridge University Press:  25 July 2016

Ruoqian Lin ,
Lili Han  and
Huolin L. Xin
Ruoqian Lin
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY
Lili Han
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY
Huolin L. Xin
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 724 - 725
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Sharma, R. & Weiss, K. Microscopy Research and Technique 42(4), 270 (1998).3.0.CO;2-U>CrossRefGoogle Scholar
[2] Xin, HL, et al, Microscopy and Microanalysis 19(06), 1558 (2013).Google Scholar
[3] Xin, HL, et al, Nano Letters 14(6), 3203 (2014).Google Scholar
[4] Xin, HL, et al, Utramicroscopy, 19, 38 (2014) and HL Xin et al, Phys. Rev. B., 90, 214305 (2014).Google Scholar
[5] Research carried out at the CFN/BNL, which is supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-SC0012704.Google Scholar