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Probing Stress-Induced Grain Boundary Migration and Hypofriction at High Resolution

Published online by Cambridge University Press:  25 July 2016

M.L. Bowers ,
C. Ophus ,
A.M. Minor  and
U. Dahmen
M.L. Bowers
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
C. Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
A.M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 712 - 713
Copyright
© Microscopy Society of America 2016 

References

[1] Mishin, Y., Asta, M. & Li, J. Acta Mater 58, 1117 (2010).Google Scholar
[2] Bowers, M.L., Ophus, C., Gautam, A., Lancon, F. & Dahmen, U. Phys. Rev. Lett. (in press.Google Scholar
[3] Radetic, T., Ophus, C., Olmsted, D.L., Asta, M. & Dahmen, U. Acta Mater. 60, 7051 (2012).Google Scholar
[4] Lancon, F., Ye, J., Caliste, D., Radetic, T., Minor, A.M. & Dahmen, U. Nano Lett. 10, 695 (2010).CrossRefGoogle Scholar
[5] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar