No CrossRef data available.
Article contents
Local strain measurements during in situ TEM deformation with nanobeam electron diffraction
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 710 - 711
- Copyright
- © Microscopy Society of America 2016
References
References:
[1]
Gammer, C., Ozdol, V. B., Liebscher, C.H. & Minor, A.M.
Diffraction Contrast Imaging Using Virtual Apertures.
Ultramicroscopy
155, p. 1–10, 2015.CrossRefGoogle Scholar
[2]
Ozdol, V.B., Gammer, C., Jin, X.G., Ercius, P., Ophus, C., Ciston, J. & Minor, A.M.
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction.
Applied Physics Letters
106, 253107
(2015).CrossRefGoogle Scholar
[3] The authors acknowledge support by the Austrian Science Fund (FWF):[J3397] and the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the U.S. Dept. of Energy under Contract # DE-AC02-05CH11231.Google Scholar
You have
Access