Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations

Abstract

Crystal Phase Mapping by Scanning Precession Electron Diffraction and Machine Learning Decomposition

Plasma Focused Ion Beam Curtaining Artifact Correction by Fourier-Based Linear Opti-mization Model

Using Virtual Reality (VR) for Real-Time Tomography Exploration of Nanoparticles

Automated Quadrat Analysis Technique for Particle Dispersion Quantification in Oxide Dispersion Strengthened Alloys

Characterization of Materials Properties by EBSD, EDS and AFM

Detection of Noise Level and Resonance Frequency Shifting Through of Principal Component Analysis (PCA) in Simulated Dataset of Band Excitation Scanning Probe Microscopy (BE-SPM)

Optimizing the Workflow for FTIR Microspectroscopy of Microplastics Present in Environmental Samples

The Joy of Scanning Electron Microscopy

Abstract

Some Thoughts on Point Spread Functions, Resolution and Image Quality

My Joy of Research in SEM

Visualizing Astigmatism in the SEM Electron Probe

Detection Systems of Ultra-High-Resolution SEMs

'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"

EBSD: Now Spanning Centimeters to Nanometers!

Complementarity of On-Axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM

Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr

Non-local Denoising of EBSD Patterns for Enhanced Indexing

Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development

The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias

Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope

Joy of Scanning with Electron and X-ray Imaging

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations

Abstract

The Joy of Scanning Electron Microscopy

Abstract