Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T01:31:27.033Z Has data issue: false hasContentIssue false
  • English
  • Français

My Joy of Research in SEM

Published online by Cambridge University Press:  01 August 2018

Raynald Gauvin
Raynald Gauvin*
Affiliation:
Department of Materials Engineering, McGill University, Montréal, Québec, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 602 - 603
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Joy, D. C., Newbury, D. E. Myklebust, R. L. (1982) J. Microsc-Oxford 128, RP1–RP2.Google Scholar
[2] Gauvin, R. L'Espérance, G. (1992) Journal of Microscopy Vol. 168(pt. 2 pp 153–167.Google Scholar
[3] Gauvin, R., L'Espérance, G. St-Laurent, S. (1992) Scanning Vol. 14, pp 37–48.Google Scholar
[4] Hovington, P., Drouin, D. Gauvin, R. (1997) Scanning Vol.19, pp 1–14.Google Scholar
[5] Brodusch, N., Demers, H. Gauvin, R. (2018) Scanning Electron Microscopy, New Perspectives in Materials Characterization. Springer.Google Scholar