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Non-local Denoising of EBSD Patterns for Enhanced Indexing

Published online by Cambridge University Press:  01 August 2018

David J. Rowenhorst  and
Patrick T. Brewick
David J. Rowenhorst
Affiliation:
U.S. Naval Research Laboratory, Code 6350, Washington, DC 20375
Patrick T. Brewick
Affiliation:
U.S. Naval Research Laboratory, Code 6350, Washington, DC 20375

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 616 - 617
Copyright
© Microscopy Society of America 2018 

References

[1] Wright, S.I., etal, Ultramicroscopy vol. 159 2015) p 81.Google Scholar
[2] Chen, Y.H., et al, Microsc. Microanal vol. 21 2015) p 739.Google Scholar
[3] Buades, A., Coll, B. Morel, J. M. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2005, vol. 2, (2005) p. 60.Google Scholar
[4] This work was funded by the Naval Research Laboratory under the auspices of the Office of Naval Research and from the Structural Metallics program of ONR.Google Scholar