Analytical and Instrumentation Science Symposia
Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations
Abstract
Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 546-547
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Correlation of c-Axis Orientation of a-Titanium Grains with Polarized Light Optical Microscopy Intensity Profiles
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- 01 August 2018, pp. 548-549
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Indexing of Large SEM Diffraction Data Sets Using a Dictionary Approach
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 550-551
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3D Analysis of Large Volumes Through Automated Serial Sectioning David
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- 01 August 2018, pp. 552-553
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Light Optical Microscopy Based Automated 3D Serial Sectioning Enables Defect Analysis in Large Volumes of Additively Manufactured Alloy Samples
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- 01 August 2018, pp. 554-555
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Real-Time Tomography with Interactive 3D Visualization using tomviz
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- 01 August 2018, pp. 556-557
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Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials
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- 01 August 2018, pp. 558-559
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Dragonfly as a Flexible Platform for Interpreting and Processing Hyperspectral and other High-dimensional Images
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 560-561
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All Mixed Up: Using Machine Learning to Address Heterogeneity in (Natural) Materials
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- 01 August 2018, pp. 562-563
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Modernizing Microscopy Data Infrastructure: Data and Metadata Curation
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- 01 August 2018, pp. 564-565
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Automated Prediction of Pseudo-Symmetry Issues in EBSD
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 566-567
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Image Calculations vs. Experimental Micrographs
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 568-569
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Simultaneous Tracking and Registration in SiC/SiC Serial Section Images
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- 01 August 2018, pp. 570-571
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A Novel Method for Automatic Determination of the Number of Meaningful Components in the PCA Analysis of Spectrum-Images
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 572-573
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Bayesian Analysis of Electron Spectroscopic SEM Images
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 574-575
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Improvement of Principal Component Analysis for Quantification of Spectrum-Imaging Datasets
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- 01 August 2018, pp. 576-577
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Image and Spectrum Image Denoising under the local low Rank Assumption
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 578-579
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A Simple Method to Estimate Local Absolute Thickness Using Scanning Transmission Electron Microscopy
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- 01 August 2018, pp. 580-581
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QSAED3, a Program for Quantification and Processing of SAED Patterns
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- 01 August 2018, pp. 582-583
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Orientation Mapping by Electron Channeling (OMEC) of Polycrystals Using a Stage-Rocked Big-Data Approach
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 584-585
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