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Indexing of Large SEM Diffraction Data Sets Using a Dictionary Approach

Published online by Cambridge University Press:  01 August 2018

Marc De Graef*
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh, PA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Pascal, E., et al, Ultramicroscopy 187 2018) p. 98.Google Scholar
[2] Pizer, S. M., et al, Computer Vision, Graphics and Image Processing 39 1987) p. 355.Google Scholar
[3] Powell, M. J. D. Technical Report University of Cambridge 2009.Google Scholar
[4] The author acknowledges ONR Vannevar Bush Faculty Fellowship support (N00014-16-1-2821) as well as the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785.Google Scholar