Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

X-Ray Imaging and Analysis

Abstract

Automated Analysis of EDS Maps

Characterisation of Recycled Aggregate Concrete Through X-Ray Mapping

Analysis of Food Packaging Layered Polymers by SEM/EDS and Raman Spectroscopy

Quantification of Elemental Distribution in Spherical Core-Shell Nanoparticles Measured by STEM-EDX

Chemically Specific Buried Interface Imaging with a Coherent EUV Nanoscope

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

Simple Specimen Preparation Method for In Situ Heating Experiments

Manipulation of Ceramic Fibers to EXpressLO™ Grids for FIB/TEM Analysis

Focused Ion Beam on Radioactive Specimens: Operational Challenges and Approach

Quantification of STEM-EDS With Ion Implantation

Nanoscale Analysis of Humidity Dependent Tonal Appearance of Platinum/Palladium Prints

FIB milling of polymer ceramic nanocomposites: far-reaching thermal artefacts and application to analysis of corrosion barrier coatings

Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals and Non Metals

Evaluation of Neon Focused Ion Beam Milling for TEM Sample Preparation

Femtosecond Laser Damage in Metals and Semiconductors During TriBeam Tomography

FIB-Milled Nanopore Sensors for Tracking Virus Assembly

Use of Single Crystal Masks for Improved Mill Characteristics in High Current Xenon Plasma FIB instrumentation

The Neon Focused Ion Beam-Stabilizing the Emission Process

GFIS in Semiconductor Applications

Polarization Control via He-ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors

SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

X-Ray Imaging and Analysis

Abstract

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract