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Manipulation of Ceramic Fibers to EXpressLO™ Grids for FIB/TEM Analysis

Published online by Cambridge University Press:  25 July 2016

Lucille A. Giannuzzi ,
Shay L. Harrison ,
Kirk L. Williams ,
Ram K. Goduguchinta ,
Erik G. Vaaler ,
John L. Schneiter  and
Joseph Pegna
Lucille A. Giannuzzi
Affiliation:
L.A. Giannuzzi & Associates LLC, Fort Myers, FL 33971USA EXpressLO LLC, Lehigh Acres, FL 33971USA
Shay L. Harrison
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA
Kirk L. Williams
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA
Ram K. Goduguchinta
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA
Erik G. Vaaler
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA
John L. Schneiter
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA
Joseph Pegna
Affiliation:
Free Form Fibers, Saratoga Springs, NY 12866USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 134 - 135
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Giannuzzi, L.A., et al., in L.A. Giannuzzi & F.A. Stevie (eds.) Intro. to Focused Ion Beams (2005) Springer. p 201–228.CrossRefGoogle Scholar
[2] Anderson, R. & Klepeis, S.J. in L.A. Giannuzzi & F.A. Stevie (eds.) Intro. to Focused Ion Beams (2005) Springer, 173–200.CrossRefGoogle Scholar
[3] Vitale, S., et al., Microsc. Microanal. 22 (2016). (this volume).CrossRefGoogle Scholar
[4] Giannuzzi, L.A., et al., Microsc. Microanal. 21 (2015). p 1032.Google Scholar
[5] Anzalone, P.A. & Giannuzzi, L.A. Microsc. Microanal. 22 (2016). (this volume).Google Scholar
[6] www.YouTube.com/LAGiannuzzi/videos.Google Scholar
[7] FIB work was performed at the Arizona State University John M. Cowley Center for High Resolution Electron Microscopy, Tempe, AZ, and courtesy of Technical Sales Solutions, Beaverton, OR. TEM images were obtained using an FEI TF20 at Portland State University.Google Scholar