Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

High-entropy Alloys Fabricated Through Powder Metallurgy for Low-temperature Applications

The Effect of Beam Scan Strategies on the Microstructure of EBM Additively Manufactured Inconel 738

Multi-Material Binder Jet Printing of Functional Ni-Mn-Ga Alloys

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Streamlining Processing and Utilization of EM Data - An Efficient Open-source Solution

NexusLIMS: Leveraging Shared Microscopy Resources for Data Analysis with a Configurable Laboratory Information Management System

A Python Based Open-source Multislice Simulation Package for Transmission Electron Microscopy

A Universal Scripting Engine for Transmission Electron Microscopy

STEMTooL: An Open Source Python Toolkit for Analyzing Electron Microscopy Datasets

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Retaining Precision at Low-dose and High-speed STEM Imaging Conditions

Atomic and Electronic Structure Evolution of ZIF-L Metal Organic Framework During Amorphization

Atomic-scale Imaging of Atomically-thin Organic Crystals via Low-dose STEM

High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films

Electron Beam Aberration Correction Using Optical Fields

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis

Investigation of Vortex Pinning in Ni Doped BaFe2As2 Superconductor with Machine-learning

Use of Ferroelectric Single-crystal Bimorphs for Precise Positioning in Scanning Probe Microscope

Electrostatic Force Microscopy: Measuring Ion Mobility, Non-linear Optical Signals and Achieving Ultimate Time Resolution

Spectral Classification of Structurally Organized Adatom Configurations

High-resolution Label-free 3D Mapping of metabolites of Single Living Cells

High-Resolving Power, Multi-Modal, and Correlative SIMS Imaging in Biology, Geology, and Materials

Application of SIMS and APT to Understand Scale Dependent U-Pb Isotope Behavior in Zircon

Power of TOF-SIMS Tandem MS Imaging: Industrial Problem Solving to Investigating Nature

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis

High-Resolving Power, Multi-Modal, and Correlative SIMS Imaging in Biology, Geology, and Materials