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Retaining Precision at Low-dose and High-speed STEM Imaging Conditions

Published online by Cambridge University Press:  30 July 2020

Tiarnan Mullarkey ,
Clive Downing  and
Lewys Jones
Tiarnan Mullarkey
Affiliation:
Centre for Doctoral Training in the Advanced Characterisation of Materials. School of Physics, Trinity College Dublin, Dublin 2, Ireland, Dublin, Dublin, Ireland
Clive Downing
Affiliation:
Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin 2, Ireland, Dublin, Dublin, Ireland
Lewys Jones
Affiliation:
Trinity College Dublin, Dublin, Dublin, Ireland

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2964 - 2966
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Copyright
Copyright © Microscopy Society of America 2020

References

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Jones, L. and Downing, C., “The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing,” Microsc. Microanal., vol. 24, no. S1, pp. 478–479, 2018.10.1017/S143192761800288XCrossRefGoogle Scholar
Tiarnan Mullarkey acknowledges funding from the SFI CDT ACM and AMBER2, and Lewys Jones acknowledges funding from SFI and the Royal Society.Google Scholar