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Power of TOF-SIMS Tandem MS Imaging: Industrial Problem Solving to Investigating Nature

Published online by Cambridge University Press:  30 July 2020

Andrew Giordani
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States
David Carr
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States
Ashley Ellsworth
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States
Scott Bryan
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States
Gregory Fisher
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States

Abstract

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Type
High-Resolving Power, Multi-Modal, and Correlative SIMS Imaging in Biology, Geology, and Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Green, F. M., Gilmore, I. S., and Seah, M. P., J. Am. Soc. Mass Spectrom., 17, 514 (2006).10.1016/j.jasms.2005.12.005CrossRefGoogle Scholar
Fisher, G.L., Hammond, J.S., Larson, P.E., Bryan, S.R., and Heeren, R.M.A., J. Vac. Sci. Technol. B, 34 (2016).10.1116/1.4943568CrossRefGoogle Scholar