Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions

Observing Structural Dynamics and Measuring Chemical Kinetics in Low Dimensional Materials Using High Speed Imaging

Making Compressive Sensing Accessible in Scientific Imaging

Viability of Compressed Sensing as a Dose Reduction Strategy in STEM

Compressive Sensing on Diverse STEM Scans: Real-time Feedback, Low-dose and Dynamic Range

Probing Local Structures and Disorder in Graphitic Carbon Nitrides

Characterization of Catalyst-nanomaterials with Myriad Modalities of Transmission Electron Microscopy

Investigation of Image Contrast in Biological Samples by Pixelated STEM Detector

Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene

Electron Beam-Induced Effects on Bi6S2O15 Nanowires: An Insight into Stability and Applications

Sandwich Structure in Al-Cu(-Au) Alloys—Characterization by Atomic-Resolution HAADF-STEM and EDXS-STEM

The Effect of the Ion Beam Energy on M-plane InGaN Layer Preparation for STEM

Electron-Beam-Damage in Metal Organic Frameworks in the TEM

Analytical Cryo Electron Microscopy for Characterization of Pickering Emulsions

High Resolution TEM Imaging of Polymer Crystals using Low Dose Techniques

Co-evolution of Microstructure and Magnetic Properties in Magnetically Aligned MnBi-Bi Composites

Single Electron Interferometry: A Step Toward Quantum Electron Microscopy

Low Dose-Rate High-Resolution Transmission Electron Microscopy of Group III – Nitride Electronic Device Structures Using a Direct Electron Detector

Low Dose TEM on the Degradation of the MAPbI3 Perovskite

Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples

Imaging Chiral Materials with Photon-Induced Near-Field Electron Microscopy

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions